MIPS: Yosemite, Emma: Fix off-by-two in arcs_cmdline buffer size check
[linux-2.6/linux-mips.git] / drivers / mtd / onenand / onenand_bbt.c
blobfc2c16a0fd1cd4fbf4e76e33ac87578aaf0b38d7
1 /*
2 * linux/drivers/mtd/onenand/onenand_bbt.c
4 * Bad Block Table support for the OneNAND driver
6 * Copyright(c) 2005 Samsung Electronics
7 * Kyungmin Park <kyungmin.park@samsung.com>
9 * Derived from nand_bbt.c
11 * TODO:
12 * Split BBT core and chip specific BBT.
15 #include <linux/slab.h>
16 #include <linux/mtd/mtd.h>
17 #include <linux/mtd/onenand.h>
19 /**
20 * check_short_pattern - [GENERIC] check if a pattern is in the buffer
21 * @param buf the buffer to search
22 * @param len the length of buffer to search
23 * @param paglen the pagelength
24 * @param td search pattern descriptor
26 * Check for a pattern at the given place. Used to search bad block
27 * tables and good / bad block identifiers. Same as check_pattern, but
28 * no optional empty check and the pattern is expected to start
29 * at offset 0.
32 static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td)
34 int i;
35 uint8_t *p = buf;
37 /* Compare the pattern */
38 for (i = 0; i < td->len; i++) {
39 if (p[i] != td->pattern[i])
40 return -1;
42 return 0;
45 /**
46 * create_bbt - [GENERIC] Create a bad block table by scanning the device
47 * @param mtd MTD device structure
48 * @param buf temporary buffer
49 * @param bd descriptor for the good/bad block search pattern
50 * @param chip create the table for a specific chip, -1 read all chips.
51 * Applies only if NAND_BBT_PERCHIP option is set
53 * Create a bad block table by scanning the device
54 * for the given good/bad block identify pattern
56 static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip)
58 struct onenand_chip *this = mtd->priv;
59 struct bbm_info *bbm = this->bbm;
60 int i, j, numblocks, len, scanlen;
61 int startblock;
62 loff_t from;
63 size_t readlen, ooblen;
64 struct mtd_oob_ops ops;
65 int rgn;
67 printk(KERN_INFO "Scanning device for bad blocks\n");
69 len = 2;
71 /* We need only read few bytes from the OOB area */
72 scanlen = ooblen = 0;
73 readlen = bd->len;
75 /* chip == -1 case only */
76 /* Note that numblocks is 2 * (real numblocks) here;
77 * see i += 2 below as it makses shifting and masking less painful
79 numblocks = this->chipsize >> (bbm->bbt_erase_shift - 1);
80 startblock = 0;
81 from = 0;
83 ops.mode = MTD_OOB_PLACE;
84 ops.ooblen = readlen;
85 ops.oobbuf = buf;
86 ops.len = ops.ooboffs = ops.retlen = ops.oobretlen = 0;
88 for (i = startblock; i < numblocks; ) {
89 int ret;
91 for (j = 0; j < len; j++) {
92 /* No need to read pages fully,
93 * just read required OOB bytes */
94 ret = onenand_bbt_read_oob(mtd,
95 from + j * this->writesize + bd->offs, &ops);
97 /* If it is a initial bad block, just ignore it */
98 if (ret == ONENAND_BBT_READ_FATAL_ERROR)
99 return -EIO;
101 if (ret || check_short_pattern(&buf[j * scanlen],
102 scanlen, this->writesize, bd)) {
103 bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
104 printk(KERN_INFO "OneNAND eraseblock %d is an "
105 "initial bad block\n", i >> 1);
106 mtd->ecc_stats.badblocks++;
107 break;
110 i += 2;
112 if (FLEXONENAND(this)) {
113 rgn = flexonenand_region(mtd, from);
114 from += mtd->eraseregions[rgn].erasesize;
115 } else
116 from += (1 << bbm->bbt_erase_shift);
119 return 0;
124 * onenand_memory_bbt - [GENERIC] create a memory based bad block table
125 * @param mtd MTD device structure
126 * @param bd descriptor for the good/bad block search pattern
128 * The function creates a memory based bbt by scanning the device
129 * for manufacturer / software marked good / bad blocks
131 static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd)
133 struct onenand_chip *this = mtd->priv;
135 bd->options &= ~NAND_BBT_SCANEMPTY;
136 return create_bbt(mtd, this->page_buf, bd, -1);
140 * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
141 * @param mtd MTD device structure
142 * @param offs offset in the device
143 * @param allowbbt allow access to bad block table region
145 static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
147 struct onenand_chip *this = mtd->priv;
148 struct bbm_info *bbm = this->bbm;
149 int block;
150 uint8_t res;
152 /* Get block number * 2 */
153 block = (int) (onenand_block(this, offs) << 1);
154 res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
156 DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
157 (unsigned int) offs, block >> 1, res);
159 switch ((int) res) {
160 case 0x00: return 0;
161 case 0x01: return 1;
162 case 0x02: return allowbbt ? 0 : 1;
165 return 1;
169 * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
170 * @param mtd MTD device structure
171 * @param bd descriptor for the good/bad block search pattern
173 * The function checks, if a bad block table(s) is/are already
174 * available. If not it scans the device for manufacturer
175 * marked good / bad blocks and writes the bad block table(s) to
176 * the selected place.
178 * The bad block table memory is allocated here. It is freed
179 * by the onenand_release function.
182 int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
184 struct onenand_chip *this = mtd->priv;
185 struct bbm_info *bbm = this->bbm;
186 int len, ret = 0;
188 len = this->chipsize >> (this->erase_shift + 2);
189 /* Allocate memory (2bit per block) and clear the memory bad block table */
190 bbm->bbt = kzalloc(len, GFP_KERNEL);
191 if (!bbm->bbt) {
192 printk(KERN_ERR "onenand_scan_bbt: Out of memory\n");
193 return -ENOMEM;
196 /* Set the bad block position */
197 bbm->badblockpos = ONENAND_BADBLOCK_POS;
199 /* Set erase shift */
200 bbm->bbt_erase_shift = this->erase_shift;
202 if (!bbm->isbad_bbt)
203 bbm->isbad_bbt = onenand_isbad_bbt;
205 /* Scan the device to build a memory based bad block table */
206 if ((ret = onenand_memory_bbt(mtd, bd))) {
207 printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
208 kfree(bbm->bbt);
209 bbm->bbt = NULL;
212 return ret;
216 * Define some generic bad / good block scan pattern which are used
217 * while scanning a device for factory marked good / bad blocks.
219 static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
221 static struct nand_bbt_descr largepage_memorybased = {
222 .options = 0,
223 .offs = 0,
224 .len = 2,
225 .pattern = scan_ff_pattern,
229 * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
230 * @param mtd MTD device structure
232 * This function selects the default bad block table
233 * support for the device and calls the onenand_scan_bbt function
235 int onenand_default_bbt(struct mtd_info *mtd)
237 struct onenand_chip *this = mtd->priv;
238 struct bbm_info *bbm;
240 this->bbm = kzalloc(sizeof(struct bbm_info), GFP_KERNEL);
241 if (!this->bbm)
242 return -ENOMEM;
244 bbm = this->bbm;
246 /* 1KB page has same configuration as 2KB page */
247 if (!bbm->badblock_pattern)
248 bbm->badblock_pattern = &largepage_memorybased;
250 return onenand_scan_bbt(mtd, bbm->badblock_pattern);
253 EXPORT_SYMBOL(onenand_scan_bbt);
254 EXPORT_SYMBOL(onenand_default_bbt);