coroutine: add test-coroutine --benchmark-lifecycle
[qemu/stefanha.git] / hw / flash.h
blobc22e1a922c34fbc430b9c55343f5bd0930f75e7a
1 /* NOR flash devices */
2 typedef struct pflash_t pflash_t;
4 /* pflash_cfi01.c */
5 pflash_t *pflash_cfi01_register(target_phys_addr_t base, ram_addr_t off,
6 BlockDriverState *bs,
7 uint32_t sector_len, int nb_blocs, int width,
8 uint16_t id0, uint16_t id1,
9 uint16_t id2, uint16_t id3, int be);
11 /* pflash_cfi02.c */
12 pflash_t *pflash_cfi02_register(target_phys_addr_t base, ram_addr_t off,
13 BlockDriverState *bs, uint32_t sector_len,
14 int nb_blocs, int nb_mappings, int width,
15 uint16_t id0, uint16_t id1,
16 uint16_t id2, uint16_t id3,
17 uint16_t unlock_addr0, uint16_t unlock_addr1,
18 int be);
20 /* nand.c */
21 typedef struct NANDFlashState NANDFlashState;
22 NANDFlashState *nand_init(int manf_id, int chip_id);
23 void nand_done(NANDFlashState *s);
24 void nand_setpins(NANDFlashState *s, uint8_t cle, uint8_t ale,
25 uint8_t ce, uint8_t wp, uint8_t gnd);
26 void nand_getpins(NANDFlashState *s, int *rb);
27 void nand_setio(NANDFlashState *s, uint8_t value);
28 uint8_t nand_getio(NANDFlashState *s);
30 #define NAND_MFR_TOSHIBA 0x98
31 #define NAND_MFR_SAMSUNG 0xec
32 #define NAND_MFR_FUJITSU 0x04
33 #define NAND_MFR_NATIONAL 0x8f
34 #define NAND_MFR_RENESAS 0x07
35 #define NAND_MFR_STMICRO 0x20
36 #define NAND_MFR_HYNIX 0xad
37 #define NAND_MFR_MICRON 0x2c
39 /* onenand.c */
40 void onenand_base_update(void *opaque, target_phys_addr_t new);
41 void onenand_base_unmap(void *opaque);
42 void *onenand_init(uint32_t id, int regshift, qemu_irq irq);
43 void *onenand_raw_otp(void *opaque);
45 /* ecc.c */
46 typedef struct {
47 uint8_t cp; /* Column parity */
48 uint16_t lp[2]; /* Line parity */
49 uint16_t count;
50 } ECCState;
52 uint8_t ecc_digest(ECCState *s, uint8_t sample);
53 void ecc_reset(ECCState *s);
54 extern VMStateDescription vmstate_ecc_state;