1 .. SPDX-License-Identifier: GPL-2.0
9 The fundamental unit in KUnit is the test case. A test case is a function with
10 the signature ``void (*)(struct kunit *test)``. It calls the function under test
11 and then sets *expectations* for what should happen. For example:
15 void example_test_success(struct kunit *test)
19 void example_test_failure(struct kunit *test)
21 KUNIT_FAIL(test, "This test never passes.");
24 In the above example, ``example_test_success`` always passes because it does
25 nothing; no expectations are set, and therefore all expectations pass. On the
26 other hand ``example_test_failure`` always fails because it calls ``KUNIT_FAIL``,
27 which is a special expectation that logs a message and causes the test case to
32 An *expectation* specifies that we expect a piece of code to do something in a
33 test. An expectation is called like a function. A test is made by setting
34 expectations about the behavior of a piece of code under test. When one or more
35 expectations fail, the test case fails and information about the failure is
40 void add_test_basic(struct kunit *test)
42 KUNIT_EXPECT_EQ(test, 1, add(1, 0));
43 KUNIT_EXPECT_EQ(test, 2, add(1, 1));
46 In the above example, ``add_test_basic`` makes a number of assertions about the
47 behavior of a function called ``add``. The first parameter is always of type
48 ``struct kunit *``, which contains information about the current test context.
49 The second parameter, in this case, is what the value is expected to be. The
50 last value is what the value actually is. If ``add`` passes all of these
51 expectations, the test case, ``add_test_basic`` will pass; if any one of these
52 expectations fails, the test case will fail.
54 A test case *fails* when any expectation is violated; however, the test will
55 continue to run, and try other expectations until the test case ends or is
56 otherwise terminated. This is as opposed to *assertions* which are discussed
59 To learn about more KUnit expectations, see Documentation/dev-tools/kunit/api/test.rst.
62 A single test case should be short, easy to understand, and focused on a
65 For example, if we want to rigorously test the ``add`` function above, create
66 additional tests cases which would test each property that an ``add`` function
67 should have as shown below:
71 void add_test_basic(struct kunit *test)
73 KUNIT_EXPECT_EQ(test, 1, add(1, 0));
74 KUNIT_EXPECT_EQ(test, 2, add(1, 1));
77 void add_test_negative(struct kunit *test)
79 KUNIT_EXPECT_EQ(test, 0, add(-1, 1));
82 void add_test_max(struct kunit *test)
84 KUNIT_EXPECT_EQ(test, INT_MAX, add(0, INT_MAX));
85 KUNIT_EXPECT_EQ(test, -1, add(INT_MAX, INT_MIN));
88 void add_test_overflow(struct kunit *test)
90 KUNIT_EXPECT_EQ(test, INT_MIN, add(INT_MAX, 1));
96 An assertion is like an expectation, except that the assertion immediately
97 terminates the test case if the condition is not satisfied. For example:
101 static void test_sort(struct kunit *test)
104 a = kunit_kmalloc_array(test, TEST_LEN, sizeof(*a), GFP_KERNEL);
105 KUNIT_ASSERT_NOT_ERR_OR_NULL(test, a);
106 for (i = 0; i < TEST_LEN; i++) {
107 r = (r * 725861) % 6599;
110 sort(a, TEST_LEN, sizeof(*a), cmpint, NULL);
111 for (i = 0; i < TEST_LEN-1; i++)
112 KUNIT_EXPECT_LE(test, a[i], a[i + 1]);
115 In this example, we need to be able to allocate an array to test the ``sort()``
116 function. So we use ``KUNIT_ASSERT_NOT_ERR_OR_NULL()`` to abort the test if
117 there's an allocation error.
120 In other test frameworks, ``ASSERT`` macros are often implemented by calling
121 ``return`` so they only work from the test function. In KUnit, we stop the
122 current kthread on failure, so you can call them from anywhere.
125 Warning: There is an exception to the above rule. You shouldn't use assertions
126 in the suite's exit() function, or in the free function for a resource. These
127 run when a test is shutting down, and an assertion here prevents further
128 cleanup code from running, potentially leading to a memory leak.
130 Customizing error messages
131 --------------------------
133 Each of the ``KUNIT_EXPECT`` and ``KUNIT_ASSERT`` macros have a ``_MSG``
134 variant. These take a format string and arguments to provide additional
135 context to the automatically generated error messages.
140 generate_sha1_hex_string(some_str);
142 /* Before. Not easy to tell why the test failed. */
143 KUNIT_EXPECT_EQ(test, strlen(some_str), 40);
145 /* After. Now we see the offending string. */
146 KUNIT_EXPECT_EQ_MSG(test, strlen(some_str), 40, "some_str='%s'", some_str);
148 Alternatively, one can take full control over the error message by using
149 ``KUNIT_FAIL()``, e.g.
154 KUNIT_EXPECT_EQ(test, some_setup_function(), 0);
156 /* After: full control over the failure message. */
157 if (some_setup_function())
158 KUNIT_FAIL(test, "Failed to setup thing for testing");
164 We need many test cases covering all the unit's behaviors. It is common to have
165 many similar tests. In order to reduce duplication in these closely related
166 tests, most unit testing frameworks (including KUnit) provide the concept of a
167 *test suite*. A test suite is a collection of test cases for a unit of code
168 with optional setup and teardown functions that run before/after the whole
169 suite and/or every test case.
172 A test case will only run if it is associated with a test suite.
178 static struct kunit_case example_test_cases[] = {
179 KUNIT_CASE(example_test_foo),
180 KUNIT_CASE(example_test_bar),
181 KUNIT_CASE(example_test_baz),
185 static struct kunit_suite example_test_suite = {
187 .init = example_test_init,
188 .exit = example_test_exit,
189 .suite_init = example_suite_init,
190 .suite_exit = example_suite_exit,
191 .test_cases = example_test_cases,
193 kunit_test_suite(example_test_suite);
195 In the above example, the test suite ``example_test_suite`` would first run
196 ``example_suite_init``, then run the test cases ``example_test_foo``,
197 ``example_test_bar``, and ``example_test_baz``. Each would have
198 ``example_test_init`` called immediately before it and ``example_test_exit``
199 called immediately after it. Finally, ``example_suite_exit`` would be called
200 after everything else. ``kunit_test_suite(example_test_suite)`` registers the
201 test suite with the KUnit test framework.
204 The ``exit`` and ``suite_exit`` functions will run even if ``init`` or
205 ``suite_init`` fail. Make sure that they can handle any inconsistent
206 state which may result from ``init`` or ``suite_init`` encountering errors
209 ``kunit_test_suite(...)`` is a macro which tells the linker to put the
210 specified test suite in a special linker section so that it can be run by KUnit
211 either after ``late_init``, or when the test module is loaded (if the test was
214 For more information, see Documentation/dev-tools/kunit/api/test.rst.
216 .. _kunit-on-non-uml:
218 Writing Tests For Other Architectures
219 -------------------------------------
221 It is better to write tests that run on UML to tests that only run under a
222 particular architecture. It is better to write tests that run under QEMU or
223 another easy to obtain (and monetarily free) software environment to a specific
226 Nevertheless, there are still valid reasons to write a test that is architecture
227 or hardware specific. For example, we might want to test code that really
228 belongs in ``arch/some-arch/*``. Even so, try to write the test so that it does
229 not depend on physical hardware. Some of our test cases may not need hardware,
230 only few tests actually require the hardware to test it. When hardware is not
231 available, instead of disabling tests, we can skip them.
233 Now that we have narrowed down exactly what bits are hardware specific, the
234 actual procedure for writing and running the tests is same as writing normal
238 We may have to reset hardware state. If this is not possible, we may only
239 be able to run one test case per invocation.
241 .. TODO(brendanhiggins@google.com): Add an actual example of an architecture-
242 dependent KUnit test.
250 Unit testing limits the amount of code under test to a single unit. It controls
251 what code gets run when the unit under test calls a function. Where a function
252 is exposed as part of an API such that the definition of that function can be
253 changed without affecting the rest of the code base. In the kernel, this comes
254 from two constructs: classes, which are structs that contain function pointers
255 provided by the implementer, and architecture-specific functions, which have
256 definitions selected at compile time.
261 Classes are not a construct that is built into the C programming language;
262 however, it is an easily derived concept. Accordingly, in most cases, every
263 project that does not use a standardized object oriented library (like GNOME's
264 GObject) has their own slightly different way of doing object oriented
265 programming; the Linux kernel is no exception.
267 The central concept in kernel object oriented programming is the class. In the
268 kernel, a *class* is a struct that contains function pointers. This creates a
269 contract between *implementers* and *users* since it forces them to use the
270 same function signature without having to call the function directly. To be a
271 class, the function pointers must specify that a pointer to the class, known as
272 a *class handle*, be one of the parameters. Thus the member functions (also
273 known as *methods*) have access to member variables (also known as *fields*)
274 allowing the same implementation to have multiple *instances*.
276 A class can be *overridden* by *child classes* by embedding the *parent class*
277 in the child class. Then when the child class *method* is called, the child
278 implementation knows that the pointer passed to it is of a parent contained
279 within the child. Thus, the child can compute the pointer to itself because the
280 pointer to the parent is always a fixed offset from the pointer to the child.
281 This offset is the offset of the parent contained in the child struct. For
287 int (*area)(struct shape *this);
296 int rectangle_area(struct shape *this)
298 struct rectangle *self = container_of(this, struct rectangle, parent);
300 return self->length * self->width;
303 void rectangle_new(struct rectangle *self, int length, int width)
305 self->parent.area = rectangle_area;
306 self->length = length;
310 In this example, computing the pointer to the child from the pointer to the
311 parent is done by ``container_of``.
316 In order to unit test a piece of code that calls a method in a class, the
317 behavior of the method must be controllable, otherwise the test ceases to be a
318 unit test and becomes an integration test.
320 A fake class implements a piece of code that is different than what runs in a
321 production instance, but behaves identical from the standpoint of the callers.
322 This is done to replace a dependency that is hard to deal with, or is slow. For
323 example, implementing a fake EEPROM that stores the "contents" in an
324 internal buffer. Assume we have a class that represents an EEPROM:
329 ssize_t (*read)(struct eeprom *this, size_t offset, char *buffer, size_t count);
330 ssize_t (*write)(struct eeprom *this, size_t offset, const char *buffer, size_t count);
333 And we want to test code that buffers writes to the EEPROM:
337 struct eeprom_buffer {
338 ssize_t (*write)(struct eeprom_buffer *this, const char *buffer, size_t count);
339 int flush(struct eeprom_buffer *this);
340 size_t flush_count; /* Flushes when buffer exceeds flush_count. */
343 struct eeprom_buffer *new_eeprom_buffer(struct eeprom *eeprom);
344 void destroy_eeprom_buffer(struct eeprom *eeprom);
346 We can test this code by *faking out* the underlying EEPROM:
351 struct eeprom parent;
352 char contents[FAKE_EEPROM_CONTENTS_SIZE];
355 ssize_t fake_eeprom_read(struct eeprom *parent, size_t offset, char *buffer, size_t count)
357 struct fake_eeprom *this = container_of(parent, struct fake_eeprom, parent);
359 count = min(count, FAKE_EEPROM_CONTENTS_SIZE - offset);
360 memcpy(buffer, this->contents + offset, count);
365 ssize_t fake_eeprom_write(struct eeprom *parent, size_t offset, const char *buffer, size_t count)
367 struct fake_eeprom *this = container_of(parent, struct fake_eeprom, parent);
369 count = min(count, FAKE_EEPROM_CONTENTS_SIZE - offset);
370 memcpy(this->contents + offset, buffer, count);
375 void fake_eeprom_init(struct fake_eeprom *this)
377 this->parent.read = fake_eeprom_read;
378 this->parent.write = fake_eeprom_write;
379 memset(this->contents, 0, FAKE_EEPROM_CONTENTS_SIZE);
382 We can now use it to test ``struct eeprom_buffer``:
386 struct eeprom_buffer_test {
387 struct fake_eeprom *fake_eeprom;
388 struct eeprom_buffer *eeprom_buffer;
391 static void eeprom_buffer_test_does_not_write_until_flush(struct kunit *test)
393 struct eeprom_buffer_test *ctx = test->priv;
394 struct eeprom_buffer *eeprom_buffer = ctx->eeprom_buffer;
395 struct fake_eeprom *fake_eeprom = ctx->fake_eeprom;
396 char buffer[] = {0xff};
398 eeprom_buffer->flush_count = SIZE_MAX;
400 eeprom_buffer->write(eeprom_buffer, buffer, 1);
401 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[0], 0);
403 eeprom_buffer->write(eeprom_buffer, buffer, 1);
404 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[1], 0);
406 eeprom_buffer->flush(eeprom_buffer);
407 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[0], 0xff);
408 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[1], 0xff);
411 static void eeprom_buffer_test_flushes_after_flush_count_met(struct kunit *test)
413 struct eeprom_buffer_test *ctx = test->priv;
414 struct eeprom_buffer *eeprom_buffer = ctx->eeprom_buffer;
415 struct fake_eeprom *fake_eeprom = ctx->fake_eeprom;
416 char buffer[] = {0xff};
418 eeprom_buffer->flush_count = 2;
420 eeprom_buffer->write(eeprom_buffer, buffer, 1);
421 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[0], 0);
423 eeprom_buffer->write(eeprom_buffer, buffer, 1);
424 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[0], 0xff);
425 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[1], 0xff);
428 static void eeprom_buffer_test_flushes_increments_of_flush_count(struct kunit *test)
430 struct eeprom_buffer_test *ctx = test->priv;
431 struct eeprom_buffer *eeprom_buffer = ctx->eeprom_buffer;
432 struct fake_eeprom *fake_eeprom = ctx->fake_eeprom;
433 char buffer[] = {0xff, 0xff};
435 eeprom_buffer->flush_count = 2;
437 eeprom_buffer->write(eeprom_buffer, buffer, 1);
438 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[0], 0);
440 eeprom_buffer->write(eeprom_buffer, buffer, 2);
441 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[0], 0xff);
442 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[1], 0xff);
443 /* Should have only flushed the first two bytes. */
444 KUNIT_EXPECT_EQ(test, fake_eeprom->contents[2], 0);
447 static int eeprom_buffer_test_init(struct kunit *test)
449 struct eeprom_buffer_test *ctx;
451 ctx = kunit_kzalloc(test, sizeof(*ctx), GFP_KERNEL);
452 KUNIT_ASSERT_NOT_ERR_OR_NULL(test, ctx);
454 ctx->fake_eeprom = kunit_kzalloc(test, sizeof(*ctx->fake_eeprom), GFP_KERNEL);
455 KUNIT_ASSERT_NOT_ERR_OR_NULL(test, ctx->fake_eeprom);
456 fake_eeprom_init(ctx->fake_eeprom);
458 ctx->eeprom_buffer = new_eeprom_buffer(&ctx->fake_eeprom->parent);
459 KUNIT_ASSERT_NOT_ERR_OR_NULL(test, ctx->eeprom_buffer);
466 static void eeprom_buffer_test_exit(struct kunit *test)
468 struct eeprom_buffer_test *ctx = test->priv;
470 destroy_eeprom_buffer(ctx->eeprom_buffer);
473 Testing Against Multiple Inputs
474 -------------------------------
476 Testing just a few inputs is not enough to ensure that the code works correctly,
477 for example: testing a hash function.
479 We can write a helper macro or function. The function is called for each input.
480 For example, to test ``sha1sum(1)``, we can write:
484 #define TEST_SHA1(in, want) \
486 KUNIT_EXPECT_STREQ_MSG(test, out, want, "sha1sum(%s)", in);
489 TEST_SHA1("hello world", "2aae6c35c94fcfb415dbe95f408b9ce91ee846ed");
490 TEST_SHA1("hello world!", "430ce34d020724ed75a196dfc2ad67c77772d169");
492 Note the use of the ``_MSG`` version of ``KUNIT_EXPECT_STREQ`` to print a more
493 detailed error and make the assertions clearer within the helper macros.
495 The ``_MSG`` variants are useful when the same expectation is called multiple
496 times (in a loop or helper function) and thus the line number is not enough to
497 identify what failed, as shown below.
499 In complicated cases, we recommend using a *table-driven test* compared to the
500 helper macro variation, for example:
507 struct sha1_test_case {
512 struct sha1_test_case cases[] = {
514 .str = "hello world",
515 .sha1 = "2aae6c35c94fcfb415dbe95f408b9ce91ee846ed",
518 .str = "hello world!",
519 .sha1 = "430ce34d020724ed75a196dfc2ad67c77772d169",
522 for (i = 0; i < ARRAY_SIZE(cases); ++i) {
523 sha1sum(cases[i].str, out);
524 KUNIT_EXPECT_STREQ_MSG(test, out, cases[i].sha1,
525 "sha1sum(%s)", cases[i].str);
529 There is more boilerplate code involved, but it can:
531 * be more readable when there are multiple inputs/outputs (due to field names).
533 * For example, see ``fs/ext4/inode-test.c``.
535 * reduce duplication if test cases are shared across multiple tests.
537 * For example: if we want to test ``sha256sum``, we could add a ``sha256``
538 field and reuse ``cases``.
540 * be converted to a "parameterized test".
542 Parameterized Testing
543 ~~~~~~~~~~~~~~~~~~~~~
545 The table-driven testing pattern is common enough that KUnit has special
548 By reusing the same ``cases`` array from above, we can write the test as a
549 "parameterized test" with the following.
553 // This is copy-pasted from above.
554 struct sha1_test_case {
558 const struct sha1_test_case cases[] = {
560 .str = "hello world",
561 .sha1 = "2aae6c35c94fcfb415dbe95f408b9ce91ee846ed",
564 .str = "hello world!",
565 .sha1 = "430ce34d020724ed75a196dfc2ad67c77772d169",
569 // Creates `sha1_gen_params()` to iterate over `cases` while using
570 // the struct member `str` for the case description.
571 KUNIT_ARRAY_PARAM_DESC(sha1, cases, str);
573 // Looks no different from a normal test.
574 static void sha1_test(struct kunit *test)
576 // This function can just contain the body of the for-loop.
577 // The former `cases[i]` is accessible under test->param_value.
579 struct sha1_test_case *test_param = (struct sha1_test_case *)(test->param_value);
581 sha1sum(test_param->str, out);
582 KUNIT_EXPECT_STREQ_MSG(test, out, test_param->sha1,
583 "sha1sum(%s)", test_param->str);
586 // Instead of KUNIT_CASE, we use KUNIT_CASE_PARAM and pass in the
587 // function declared by KUNIT_ARRAY_PARAM or KUNIT_ARRAY_PARAM_DESC.
588 static struct kunit_case sha1_test_cases[] = {
589 KUNIT_CASE_PARAM(sha1_test, sha1_gen_params),
596 Where you might use ``kzalloc``, you can instead use ``kunit_kzalloc`` as KUnit
597 will then ensure that the memory is freed once the test completes.
599 This is useful because it lets us use the ``KUNIT_ASSERT_EQ`` macros to exit
600 early from a test without having to worry about remembering to call ``kfree``.
605 void example_test_allocation(struct kunit *test)
607 char *buffer = kunit_kzalloc(test, 16, GFP_KERNEL);
608 /* Ensure allocation succeeded. */
609 KUNIT_ASSERT_NOT_ERR_OR_NULL(test, buffer);
611 KUNIT_ASSERT_STREQ(test, buffer, "");
614 Registering Cleanup Actions
615 ---------------------------
617 If you need to perform some cleanup beyond simple use of ``kunit_kzalloc``,
618 you can register a custom "deferred action", which is a cleanup function
619 run when the test exits (whether cleanly, or via a failed assertion).
621 Actions are simple functions with no return value, and a single ``void*``
622 context argument, and fulfill the same role as "cleanup" functions in Python
623 and Go tests, "defer" statements in languages which support them, and
624 (in some cases) destructors in RAII languages.
626 These are very useful for unregistering things from global lists, closing
627 files or other resources, or freeing resources.
633 static void cleanup_device(void *ctx)
635 struct device *dev = (struct device *)ctx;
637 device_unregister(dev);
640 void example_device_test(struct kunit *test)
642 struct my_device dev;
644 device_register(&dev);
646 kunit_add_action(test, &cleanup_device, &dev);
649 Note that, for functions like device_unregister which only accept a single
650 pointer-sized argument, it's possible to automatically generate a wrapper
651 with the ``KUNIT_DEFINE_ACTION_WRAPPER()`` macro, for example:
655 KUNIT_DEFINE_ACTION_WRAPPER(device_unregister, device_unregister_wrapper, struct device *);
656 kunit_add_action(test, &device_unregister_wrapper, &dev);
658 You should do this in preference to manually casting to the ``kunit_action_t`` type,
659 as casting function pointers will break Control Flow Integrity (CFI).
661 ``kunit_add_action`` can fail if, for example, the system is out of memory.
662 You can use ``kunit_add_action_or_reset`` instead which runs the action
663 immediately if it cannot be deferred.
665 If you need more control over when the cleanup function is called, you
666 can trigger it early using ``kunit_release_action``, or cancel it entirely
667 with ``kunit_remove_action``.
670 Testing Static Functions
671 ------------------------
673 If we do not want to expose functions or variables for testing, one option is to
674 conditionally export the used symbol. For example:
680 VISIBLE_IF_KUNIT int do_interesting_thing();
681 EXPORT_SYMBOL_IF_KUNIT(do_interesting_thing);
685 #if IS_ENABLED(CONFIG_KUNIT)
686 int do_interesting_thing(void);
689 Alternatively, you could conditionally ``#include`` the test file at the end of
690 your .c file. For example:
696 static int do_interesting_thing();
698 #ifdef CONFIG_MY_KUNIT_TEST
699 #include "my_kunit_test.c"
702 Injecting Test-Only Code
703 ------------------------
705 Similar to as shown above, we can add test-specific logic. For example:
711 #ifdef CONFIG_MY_KUNIT_TEST
712 /* Defined in my_kunit_test.c */
713 void test_only_hook(void);
715 void test_only_hook(void) { }
718 This test-only code can be made more useful by accessing the current ``kunit_test``
719 as shown in next section: *Accessing The Current Test*.
721 Accessing The Current Test
722 --------------------------
724 In some cases, we need to call test-only code from outside the test file. This
725 is helpful, for example, when providing a fake implementation of a function, or
726 to fail any current test from within an error handler.
727 We can do this via the ``kunit_test`` field in ``task_struct``, which we can
728 access using the ``kunit_get_current_test()`` function in ``kunit/test-bug.h``.
730 ``kunit_get_current_test()`` is safe to call even if KUnit is not enabled. If
731 KUnit is not enabled, or if no test is running in the current task, it will
732 return ``NULL``. This compiles down to either a no-op or a static key check,
733 so will have a negligible performance impact when no test is running.
735 The example below uses this to implement a "mock" implementation of a function, ``foo``:
739 #include <kunit/test-bug.h> /* for kunit_get_current_test */
743 int want_foo_called_with;
746 static int fake_foo(int arg)
748 struct kunit *test = kunit_get_current_test();
749 struct test_data *test_data = test->priv;
751 KUNIT_EXPECT_EQ(test, test_data->want_foo_called_with, arg);
752 return test_data->foo_result;
755 static void example_simple_test(struct kunit *test)
757 /* Assume priv (private, a member used to pass test data from
758 * the init function) is allocated in the suite's .init */
759 struct test_data *test_data = test->priv;
761 test_data->foo_result = 42;
762 test_data->want_foo_called_with = 1;
764 /* In a real test, we'd probably pass a pointer to fake_foo somewhere
765 * like an ops struct, etc. instead of calling it directly. */
766 KUNIT_EXPECT_EQ(test, fake_foo(1), 42);
769 In this example, we are using the ``priv`` member of ``struct kunit`` as a way
770 of passing data to the test from the init function. In general ``priv`` is
771 pointer that can be used for any user data. This is preferred over static
772 variables, as it avoids concurrency issues.
774 Had we wanted something more flexible, we could have used a named ``kunit_resource``.
775 Each test can have multiple resources which have string names providing the same
776 flexibility as a ``priv`` member, but also, for example, allowing helper
777 functions to create resources without conflicting with each other. It is also
778 possible to define a clean up function for each resource, making it easy to
779 avoid resource leaks. For more information, see Documentation/dev-tools/kunit/api/resource.rst.
781 Failing The Current Test
782 ------------------------
784 If we want to fail the current test, we can use ``kunit_fail_current_test(fmt, args...)``
785 which is defined in ``<kunit/test-bug.h>`` and does not require pulling in ``<kunit/test.h>``.
786 For example, we have an option to enable some extra debug checks on some data
787 structures as shown below:
791 #include <kunit/test-bug.h>
793 #ifdef CONFIG_EXTRA_DEBUG_CHECKS
794 static void validate_my_data(struct data *data)
799 kunit_fail_current_test("data %p is invalid", data);
801 /* Normal, non-KUnit, error reporting code here. */
804 static void my_debug_function(void) { }
807 ``kunit_fail_current_test()`` is safe to call even if KUnit is not enabled. If
808 KUnit is not enabled, or if no test is running in the current task, it will do
809 nothing. This compiles down to either a no-op or a static key check, so will
810 have a negligible performance impact when no test is running.
812 Managing Fake Devices and Drivers
813 ---------------------------------
815 When testing drivers or code which interacts with drivers, many functions will
816 require a ``struct device`` or ``struct device_driver``. In many cases, setting
817 up a real device is not required to test any given function, so a fake device
820 KUnit provides helper functions to create and manage these fake devices, which
821 are internally of type ``struct kunit_device``, and are attached to a special
822 ``kunit_bus``. These devices support managed device resources (devres), as
823 described in Documentation/driver-api/driver-model/devres.rst
825 To create a KUnit-managed ``struct device_driver``, use ``kunit_driver_create()``,
826 which will create a driver with the given name, on the ``kunit_bus``. This driver
827 will automatically be destroyed when the corresponding test finishes, but can also
828 be manually destroyed with ``driver_unregister()``.
830 To create a fake device, use the ``kunit_device_register()``, which will create
831 and register a device, using a new KUnit-managed driver created with ``kunit_driver_create()``.
832 To provide a specific, non-KUnit-managed driver, use ``kunit_device_register_with_driver()``
833 instead. Like with managed drivers, KUnit-managed fake devices are automatically
834 cleaned up when the test finishes, but can be manually cleaned up early with
835 ``kunit_device_unregister()``.
837 The KUnit devices should be used in preference to ``root_device_register()``, and
838 instead of ``platform_device_register()`` in cases where the device is not otherwise
845 #include <kunit/device.h>
847 static void test_my_device(struct kunit *test)
849 struct device *fake_device;
850 const char *dev_managed_string;
852 // Create a fake device.
853 fake_device = kunit_device_register(test, "my_device");
854 KUNIT_ASSERT_NOT_ERR_OR_NULL(test, fake_device)
856 // Pass it to functions which need a device.
857 dev_managed_string = devm_kstrdup(fake_device, "Hello, World!");
859 // Everything is cleaned up automatically when the test ends.