Merge branch 'fixes' into testing-uf
[gnucap-felix.git] / modules / d_mos123.h
blobbe646e636fd4a4ac8e07f45a79be9b4837073cd0
1 /* $Id: d_mos123.h,v 1.2 2009-12-14 14:25:38 felix Exp $ -*- C++ -*-
2 * Copyright (C) 2001 Albert Davis
3 * Author: Albert Davis <aldavis@gnu.org>
5 * This file is part of "Gnucap", the Gnu Circuit Analysis Package
7 * This program is free software; you can redistribute it and/or modify
8 * it under the terms of the GNU General Public License as published by
9 * the Free Software Foundation; either version 3, or (at your option)
10 * any later version.
12 * This program is distributed in the hope that it will be useful,
13 * but WITHOUT ANY WARRANTY; without even the implied warranty of
14 * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
15 * GNU General Public License for more details.
17 * You should have received a copy of the GNU General Public License
18 * along with this program; if not, write to the Free Software
19 * Foundation, Inc., 51 Franklin Street, Fifth Floor, Boston, MA
20 * 02110-1301, USA.
21 *------------------------------------------------------------------
22 * MOS model - base for levels 1,2,3,6
24 /* This file is automatically generated. DO NOT EDIT */
25 #ifndef D_MOS123_H_INCLUDED
26 #define D_MOS123_H_INCLUDED
28 #include "d_mos_base.h"
29 enum gate_t {gtSAME = -1, gtMETAL = 0, gtOPP = 1};
30 const double NI = 1.45e16; /* intrinsic carrier concentration */
31 #include "u_sdp.h"
32 #include "e_adp_mos.h"
33 #include "e_node.h"
34 #include "e_subckt.h"
35 #include "e_model.h"
37 namespace UF{
38 /*--------------------------------------------------------------------------*/
39 class ADP_BUILT_IN_MOS123
40 :public ADP_BUILT_IN_MOS{
41 public:
42 explicit ADP_BUILT_IN_MOS123( COMPONENT* c, const std::string n);
43 public:
44 double vto; // replace m->vto
46 void tr_accept();
48 /*--------------------------------------------------------------------------*/
49 class SDP_BUILT_IN_MOS123
50 :public SDP_BUILT_IN_MOS_BASE{
51 public:
52 explicit SDP_BUILT_IN_MOS123(const COMMON_COMPONENT* c) : SDP_BUILT_IN_MOS_BASE(c) {init(c);}
53 void init(const COMMON_COMPONENT*);
54 public:
56 /*--------------------------------------------------------------------------*/
57 class DEV_BUILT_IN_MOS;
58 class TDP_BUILT_IN_MOS123
59 :public TDP_BUILT_IN_MOS_BASE{
60 public:
61 explicit TDP_BUILT_IN_MOS123(const DEV_BUILT_IN_MOS*);
62 public:
64 /*--------------------------------------------------------------------------*/
65 class MODEL_BUILT_IN_MOS123
66 :public MODEL_BUILT_IN_MOS_BASE{
67 protected:
68 explicit MODEL_BUILT_IN_MOS123(const MODEL_BUILT_IN_MOS123& p);
69 public:
70 explicit MODEL_BUILT_IN_MOS123(const BASE_SUBCKT*);
71 ~MODEL_BUILT_IN_MOS123() {--_count;}
72 public: // override virtual
73 std::string dev_type()const;
74 void set_dev_type(const std::string& nt);
75 CARD* clone()const {return new MODEL_BUILT_IN_MOS123(*this);}
76 void precalc_first();
77 void precalc_last();
78 SDP_CARD* new_sdp( COMMON_COMPONENT* c)const;
79 ADP_CARD* new_adp( COMPONENT* c)const; // COMPONENT nicht const, wegen counter?
80 void set_param_by_index(int, std::string&, int);
81 bool param_is_printable(int)const;
82 std::string param_name(int)const;
83 std::string param_name(int,int)const;
84 std::string param_value(int)const;
85 int param_count()const {return (15 + MODEL_BUILT_IN_MOS_BASE::param_count());}
86 bool is_valid(const COMPONENT*)const;
87 void tr_eval(COMPONENT*)const;
89 void do_tr_stress( const COMPONENT* c ) const;
93 public: // not virtual
94 static int count() {return _count;}
95 private: // strictly internal
96 static int _count;
97 public: // input parameters
98 PARAMETER<double> vto_raw; // zero-bias threshold voltage
99 PARAMETER<double> gamma; // bulk threshold parameter
100 PARAMETER<double> phi; // surface potential
101 PARAMETER<double> lambda; // channel-length modulation
102 PARAMETER<double> tox; // oxide thickness
103 PARAMETER<double> nsub_cm; // substrate doping
104 PARAMETER<double> nss_cm; // surface state density
105 PARAMETER<double> xj; // metallurgical junction depth
106 PARAMETER<double> uo_cm; // surface mobility
107 PARAMETER<int> tpg; // type of gate material - really gate_t
108 public: // calculated parameters
109 double nsub; //
110 double nss; //
111 double uo; //
112 double vto; //
113 double cox; // oxide capacitance (E_OX / tox)
114 bool calc_vto; //
115 bool calc_gamma; //
116 bool calc_phi; //
117 protected: // ttt start values. not needed outside (?)
118 // ADP ids_stress; in BASE
119 double vto_0; // ?
120 double vto_raw_0; ///?
121 public:
122 virtual void do_stress_apply(COMPONENT*) const;
123 virtual void do_tt_prepare(COMPONENT*) const;
125 /*--------------------------------------------------------------------------*/
126 /*--------------------------------------------------------------------------*/
127 /*--------------------------------------------------------------------------*/
129 #endif