include/asm-sparc64/estate.h

   1 /* $Id: estate.h,v 1.1 2001/03/28 10:56:34 davem Exp $ */
   2 #ifndef _SPARC64_ESTATE_H
   3 #define _SPARC64_ESTATE_H
   4
   5 /* UltraSPARC-III E-cache Error Enable */
   6 #define ESTATE_ERROR_FMT        0x0000000000040000 /* Force MTAG ECC            */
   7 #define ESTATE_ERROR_FMESS      0x000000000003c000 /* Forced MTAG ECC val       */
   8 #define ESTATE_ERROR_FMD        0x0000000000002000 /* Force DATA ECC            */
   9 #define ESTATE_ERROR_FDECC      0x0000000000001ff0 /* Forced DATA ECC val       */
  10 #define ESTATE_ERROR_UCEEN      0x0000000000000008 /* See below                 */
  11 #define ESTATE_ERROR_NCEEN      0x0000000000000002 /* See below                 */
  12 #define ESTATE_ERROR_CEEN       0x0000000000000001 /* See below                 */
  13
  14 /* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
  15  * errors 2) uncorrectable E-cache errors.  Such events only occur on reads
  16  * of the E-cache by the local processor for: 1) data loads 2) instruction
  17  * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge
  18  * 2) writeback 2) copyout.  The AFSR bits associated with these traps are
  19  * UCC and UCU.
  20  */
  21
  22 /* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
  23  * for uncorrectable ECC errors and system errors.
  24  *
  25  * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
  26  * or system bus BusERR:
  27  * 1) As the result of an instruction fetch, will generate instruction_access_error
  28  * 2) As the result of a load etc. will generate data_access_error.
  29  * 3) As the result of store merge completion, writeback, or copyout will
  30  *    generate a disrupting ECC_error trap.
  31  * 4) As the result of such errors on instruction vector fetch can generate any
  32  *    of the 3 trap types.
  33  *
  34  * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
  35  * BERR, and TO.
  36  */
  37
  38 /* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus
  39  * reads resulting in a hardware corrected data or MTAG ECC error will generate an
  40  * ECC_error disrupting trap with this bit enabled.
  41  *
  42  * This same trap will also be generated when a hardware corrected ECC error results
  43  * during store merge, writeback, and copyout operations.
  44  */
  45
  46 /* In general, if the trap enable bits above are disabled the AFSR bits will still
  47  * log the events even though the trap will not be generated by the processor.
  48  */
  49
  50 #endif /* _SPARC64_ESTATE_H */