[InstCombine] Signed saturation tests. NFC

[llvm-core.git] / test / Assembler / 2002-12-15-GlobalResolve.ll

; RUN: llvm-as %s -o /dev/null
; RUN: verify-uselistorder %s

@X = external global i32*
@X1 = external global %T* 
@X2 = external global i32*

%T = type {i32}