Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / CodeGen / aarch64-sve2-intrinsics / acle_sve2_sm4ekey.c
blob9676c694b3652e919287ca7fe97f044cfdca1a16
1 // NOTE: Assertions have been autogenerated by utils/update_cc_test_checks.py
2 // RUN: %clang_cc1 -triple aarch64-none-linux-gnu -target-feature +sve2-sm4 -S -O1 -Werror -Wall -emit-llvm -o - %s | FileCheck %s
3 // RUN: %clang_cc1 -triple aarch64-none-linux-gnu -target-feature +sve2-sm4 -S -O1 -Werror -Wall -emit-llvm -o - -x c++ %s | FileCheck %s -check-prefix=CPP-CHECK
4 // RUN: %clang_cc1 -DSVE_OVERLOADED_FORMS -triple aarch64-none-linux-gnu -target-feature +sve2-sm4 -S -O1 -Werror -Wall -emit-llvm -o - %s | FileCheck %s
5 // RUN: %clang_cc1 -DSVE_OVERLOADED_FORMS -triple aarch64-none-linux-gnu -target-feature +sve2-sm4 -S -O1 -Werror -Wall -emit-llvm -o - -x c++ %s | FileCheck %s -check-prefix=CPP-CHECK
7 // REQUIRES: aarch64-registered-target
9 #include <arm_sve.h>
11 #ifdef SVE_OVERLOADED_FORMS
12 // A simple used,unused... macro, long enough to represent any SVE builtin.
13 #define SVE_ACLE_FUNC(A1,A2_UNUSED,A3,A4_UNUSED) A1##A3
14 #else
15 #define SVE_ACLE_FUNC(A1,A2,A3,A4) A1##A2##A3##A4
16 #endif
18 // CHECK-LABEL: @test_svsm4ekey_u32(
19 // CHECK-NEXT: entry:
20 // CHECK-NEXT: [[TMP0:%.*]] = tail call <vscale x 4 x i32> @llvm.aarch64.sve.sm4ekey(<vscale x 4 x i32> [[OP1:%.*]], <vscale x 4 x i32> [[OP2:%.*]])
21 // CHECK-NEXT: ret <vscale x 4 x i32> [[TMP0]]
23 // CPP-CHECK-LABEL: @_Z18test_svsm4ekey_u32u12__SVUint32_tS_(
24 // CPP-CHECK-NEXT: entry:
25 // CPP-CHECK-NEXT: [[TMP0:%.*]] = tail call <vscale x 4 x i32> @llvm.aarch64.sve.sm4ekey(<vscale x 4 x i32> [[OP1:%.*]], <vscale x 4 x i32> [[OP2:%.*]])
26 // CPP-CHECK-NEXT: ret <vscale x 4 x i32> [[TMP0]]
28 svuint32_t test_svsm4ekey_u32(svuint32_t op1, svuint32_t op2)
30 return SVE_ACLE_FUNC(svsm4ekey,_u32,,)(op1, op2);