Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / CodeGenCXX / Inputs / override-layout-ms.layout
blob27790e8589c46c482aa0232649a3a89fd34db319
1 *** Dumping AST Record Layout
2 Type: struct E1
4 Layout: <ASTRecordLayout
5   Size:8
6   Alignment:8
7   BaseOffsets: []>
8   VBaseOffsets: []>
9   FieldOffsets: []>
11 *** Dumping AST Record Layout
12 Type: struct Mid
14 Layout: <ASTRecordLayout
15   Size:64
16   Alignment:64
17   BaseOffsets: []>
18   VBaseOffsets: []>
19   FieldOffsets: [0]>
21 *** Dumping AST Record Layout
22 Type: struct E2
24 Layout: <ASTRecordLayout
25   Size:8
26   Alignment:8
27   BaseOffsets: []>
28   VBaseOffsets: []>
29   FieldOffsets: []>
31 *** Dumping AST Record Layout
32 Type: struct Combine
34 Layout: <ASTRecordLayout
35   Size:64
36   Alignment:64
37   BaseOffsets: [0, 0, 0]>
38   VBaseOffsets: []>
39   FieldOffsets: []>
41 *** Dumping AST Record Layout
42 Type: struct Combine2
44 Layout: <ASTRecordLayout
45   Size:128
46   Alignment:64
47   BaseOffsets: [0, 8]>
48   VBaseOffsets: []>
49   FieldOffsets: []>