Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / Sema / aarch64-sme-intrinsics / acle_sme_target.c
blob2de6d9f6877f0211aedf77892a064d944e29b6f8
1 // RUN: %clang_cc1 -triple aarch64-none-linux-gnu -target-feature +sve -fsyntax-only -verify -emit-llvm -o - %s
2 // REQUIRES: aarch64-registered-target
4 // Test that functions with the correct target attributes can use the correct SME intrinsics.
6 #include <arm_sme_draft_spec_subject_to_change.h>
8 __attribute__((target("sme")))
9 void test_sme(svbool_t pg, void *ptr) {
10 svld1_hor_za8(0, 0, pg, ptr);
13 __attribute__((target("arch=armv8-a+sme")))
14 void test_arch_sme(svbool_t pg, void *ptr) {
15 svld1_hor_vnum_za32(0, 0, pg, ptr, 0);
18 __attribute__((target("+sme")))
19 void test_plus_sme(svbool_t pg, void *ptr) {
20 svst1_ver_za16(0, 0, pg, ptr);
23 void undefined(svbool_t pg, void *ptr) {
24 svst1_ver_vnum_za64(0, 0, pg, ptr, 0); // expected-error {{'svst1_ver_vnum_za64' needs target feature sme}}