Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / Sema / aarch64-sve-intrinsics / acle_sve_target.cpp
blobf41030c18e932bc68037046a87685fa9bdff0747
1 // RUN: %clang_cc1 -triple aarch64-none-linux-gnu -fsyntax-only -verify -emit-llvm -o - -ferror-limit 100 %s
2 // REQUIRES: aarch64-registered-target
4 // Test that functions with the correct target attributes can use the correct SVE intrinsics.
5 // expected-no-diagnostics
7 #include <arm_sve.h>
9 void __attribute__((target("sve"))) test_sve(svint64_t x, svint64_t y)
11 svzip2(x, y);
14 void __attribute__((target("sve,bf16"))) test_bfloat(svfloat32_t x, svbfloat16_t y, bfloat16_t z)
16 svbfdot_n_f32(x, y, z);
19 void __attribute__((target("sve2"))) test_sve2(svbool_t pg)
21 svlogb_f16_z(pg, svundef_f16());
24 void __attribute__((target("sve2-sha3"))) test_sve2_sha3()
26 svrax1_s64(svundef_s64(), svundef_s64());
29 void __attribute__((target("sve2"))) test_f16(svbool_t pg)
31 svlogb_f16_z(pg, svundef_f16());