Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / Sema / arm-asm.c
blob24fb5a7ecd82a2c393e33b26ff48736e8f4c351f
1 // RUN: %clang_cc1 %s -triple armv7-apple-darwin -verify -fsyntax-only
3 void f (void) {
4 int Val;
5 asm volatile ("lw (r1), %0[val]": "=&b"(Val)); // expected-error {{invalid output constraint '=&b' in asm}}
6 return;
9 void test_64bit_r(void) {
10 long long foo = 0, bar = 0;
11 asm volatile("INST %0, %1" : "=r"(foo) : "r"(bar));
14 void test_clobber_conflict(void) {
15 register int x asm("r1");
16 asm volatile("nop" :: "r"(x) : "%r1"); // expected-error {{conflicts with asm clobber list}}
17 asm volatile("nop" :: "l"(x) : "%r1"); // expected-error {{conflicts with asm clobber list}}
18 asm volatile("nop" : "=r"(x) :: "%r1"); // expected-error {{conflicts with asm clobber list}}