Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / Sema / c2x-expr-range.c
blobeff0b7cd4d9f546f47af39a9ee31567f9fa9fbf0
1 // RUN: %clang_cc1 -verify -fsyntax-only -std=c2x -triple=x86_64-unknown-linux %s
3 // Regression test for bug where we used to hit an assertion due to shift amount
4 // being larger than 64 bits. We want to see a warning about too large shift
5 // amount.
6 void test1(int *a) {
7 (void)(*a >> 123456789012345678901uwb <= 0); // expected-warning {{shift count >= width of type}}
10 // Similar to test1 above, but using __uint128_t instead of __BitInt.
11 // We want to see a warning about too large shift amount.
12 void test2(__uint128_t *a) {
13 (void)(*a >> ((__uint128_t)__UINT64_MAX__ + 1) <= 0); // expected-warning {{shift count >= width of type}}
16 // Regression test for bug where a faulty warning was given. We don't expect to
17 // see any warning in this case.
18 _BitInt(128) test3(_BitInt(128) a) {
19 return a << 12wb;
22 // Similar to test3 above, but with a too large shift count. We expect to see a
23 // warning in this case.
24 _BitInt(128) test4(_BitInt(128) a) {
25 return a << 129wb; // expected-warning {{shift count >= width of type}}