Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / clang / test / SemaCXX / ms_wide_bitfield.cpp
blob0dcc787928b0a31735f0cc2c1bc9d167c006da0f
1 // RUN: %clang_cc1 -fno-rtti -emit-llvm-only -triple i686-pc-win32 -fdump-record-layouts -fsyntax-only -mms-bitfields -verify %s 2>&1
3 struct A {
4 char a : 9; // expected-error{{width of bit-field 'a' (9 bits) exceeds the size of its type (8 bits)}}
5 int b : 33; // expected-error{{width of bit-field 'b' (33 bits) exceeds the size of its type (32 bits)}}
6 bool c : 9; // expected-error{{width of bit-field 'c' (9 bits) exceeds the size of its type (8 bits)}}
7 bool d : 3;
8 };
10 int a[sizeof(A) == 1 ? 1 : -1];