Run DCE after a LoopFlatten test to reduce spurious output [nfc]
[llvm-project.git] / libcxx / test / std / input.output / iostreams.base / ios / iostate.flags / fail.pass.cpp
blobe5f1d91c57b3274b7a48e5e27f67c90e6f62f4ff
1 //===----------------------------------------------------------------------===//
2 //
3 // Part of the LLVM Project, under the Apache License v2.0 with LLVM Exceptions.
4 // See https://llvm.org/LICENSE.txt for license information.
5 // SPDX-License-Identifier: Apache-2.0 WITH LLVM-exception
6 //
7 //===----------------------------------------------------------------------===//
9 // <ios>
11 // template <class charT, class traits> class basic_ios
13 // bool fail() const;
15 #include <ios>
16 #include <streambuf>
17 #include <cassert>
19 #include "test_macros.h"
21 struct testbuf : public std::streambuf {};
23 int main(int, char**)
26 std::ios ios(0);
27 assert(ios.fail());
28 ios.setstate(std::ios::eofbit);
29 assert(ios.fail());
32 testbuf sb;
33 std::ios ios(&sb);
34 assert(!ios.fail());
35 ios.setstate(std::ios::eofbit);
36 assert(!ios.fail());
37 ios.setstate(std::ios::badbit);
38 assert(ios.fail());
39 ios.setstate(std::ios::failbit);
40 assert(ios.fail());
43 return 0;