3 * Martin Krause, TQ-Systems GmbH, martin.krause@tqs.de.
5 * See file CREDITS for list of people who contributed to this
8 * This program is free software; you can redistribute it and/or
9 * modify it under the terms of the GNU General Public License as
10 * published by the Free Software Foundation; either version 2 of
11 * the License, or (at your option) any later version.
13 * This program is distributed in the hope that it will be useful,
14 * but WITHOUT ANY WARRANTY; without even the implied warranty of
15 * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
16 * GNU General Public License for more details.
18 * You should have received a copy of the GNU General Public License
19 * along with this program; if not, write to the Free Software
20 * Foundation, Inc., 59 Temple Place, Suite 330, Boston,
32 * TRAB board specific commands. Especially commands for burn-in and function
35 #if defined(CONFIG_CMD_BSP)
37 /* limits for valid range of VCC5V in mV */
38 #define VCC5V_MIN 4500
39 #define VCC5V_MAX 5500
42 * Test strings for EEPROM test. Length of string 2 must not exceed length of
43 * string 1. Otherwise a buffer overrun could occur!
45 #define EEPROM_TEST_STRING_1 "0987654321 :tset a si siht"
46 #define EEPROM_TEST_STRING_2 "this is a test: 1234567890"
49 * min/max limits for valid contact temperature during burn in test (in
50 * degree Centigrade * 100)
52 #define MIN_CONTACT_TEMP -1000
53 #define MAX_CONTACT_TEMP +9000
55 /* blinking frequency of status LED */
56 #define LED_BLINK_FREQ 5
58 /* delay time between burn in cycles in seconds */
59 #ifndef BURN_IN_CYCLE_DELAY /* if not defined in include/configs/trab.h */
60 #define BURN_IN_CYCLE_DELAY 5
63 /* physical SRAM parameters */
64 #define SRAM_ADDR 0x02000000 /* GCS1 */
65 #define SRAM_SIZE 0x40000 /* 256 kByte */
67 /* CPLD-Register for controlling TRAB hardware functions */
68 #define CPLD_BUTTONS ((volatile unsigned long *)0x04020000)
69 #define CPLD_FILL_LEVEL ((volatile unsigned long *)0x04008000)
70 #define CPLD_ROTARY_SWITCH ((volatile unsigned long *)0x04018000)
71 #define CPLD_RS485_RE ((volatile unsigned long *)0x04028000)
73 /* I2C EEPROM device address */
74 #define I2C_EEPROM_DEV_ADDR 0x54
76 /* EEPROM address map */
77 #define EE_ADDR_TEST 192
78 #define EE_ADDR_MAX_CYCLES 256
79 #define EE_ADDR_STATUS 258
80 #define EE_ADDR_PASS_CYCLES 259
81 #define EE_ADDR_FIRST_ERROR_CYCLE 261
82 #define EE_ADDR_FIRST_ERROR_NUM 263
83 #define EE_ADDR_FIRST_ERROR_NAME 264
84 #define EE_ADDR_ACT_CYCLE 280
86 /* Bit definitions for ADCCON */
87 #define ADC_ENABLE_START 0x1
88 #define ADC_READ_START 0x2
90 #define ADC_INP_AIN0 (0x0 << 3)
91 #define ADC_INP_AIN1 (0x1 << 3)
92 #define ADC_INP_AIN2 (0x2 << 3)
93 #define ADC_INP_AIN3 (0x3 << 3)
94 #define ADC_INP_AIN4 (0x4 << 3)
95 #define ADC_INP_AIN5 (0x5 << 3)
96 #define ADC_INP_AIN6 (0x6 << 3)
97 #define ADC_INP_AIN7 (0x7 << 3)
98 #define ADC_PRSCEN 0x4000
99 #define ADC_ECFLG 0x800
104 extern int memory_post_tests (unsigned long start
, unsigned long size
);
105 extern int i2c_write (uchar
, uint
, int , uchar
* , int);
106 extern int i2c_read (uchar
, uint
, int , uchar
* , int);
107 extern void tsc2000_reg_init (void);
108 extern s32
tsc2000_contact_temp (void);
109 extern void spi_init(void);
111 /* function declarations */
112 int do_dip (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[]);
113 int do_vcc5v (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[]);
114 int do_burn_in (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[]);
115 int do_contact_temp (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[]);
116 int do_burn_in_status (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[]);
117 int i2c_write_multiple (uchar chip
, uint addr
, int alen
,
118 uchar
*buffer
, int len
);
119 int i2c_read_multiple (uchar chip
, uint addr
, int alen
,
120 uchar
*buffer
, int len
);
121 int do_temp_log (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[]);
123 /* helper functions */
124 static void adc_init (void);
125 static int adc_read (unsigned int channel
);
126 static int read_dip (void);
127 static int read_vcc5v (void);
128 static int test_dip (void);
129 static int test_vcc5v (void);
130 static int test_rotary_switch (void);
131 static int test_sram (void);
132 static int test_eeprom (void);
133 static int test_contact_temp (void);
134 static void led_set (unsigned int);
135 static void led_blink (void);
136 static void led_init (void);
137 static void sdelay (unsigned long seconds
); /* delay in seconds */
138 static int dummy (void);
139 static int read_max_cycles(void);
140 static void test_function_table_init (void);
141 static void global_vars_init (void);
142 static int global_vars_write_to_eeprom (void);
148 u16 first_error_cycle
;
150 char first_error_name
[16];
153 typedef struct test_function_s
{
158 /* max number of Burn In Functions */
161 /* table with burn in functions */
162 test_function_t test_function
[BIF_MAX
];
165 int do_burn_in (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[])
171 printf ("Usage:\n%s\n", cmdtp
->usage
);
177 test_function_table_init ();
180 if (global_vars_write_to_eeprom () != 0) {
181 printf ("%s: error writing global_vars to eeprom\n",
186 if (read_max_cycles () != 0) {
187 printf ("%s: error reading max_cycles from eeprom\n",
192 if (max_cycles
== 0) {
193 printf ("%s: error, burn in max_cycles = 0\n", __FUNCTION__
);
198 for (act_cycle
= 1; act_cycle
<= max_cycles
; act_cycle
++) {
203 * avoid timestamp overflow problem after about 68 minutes of
206 reset_timer_masked ();
207 for (i
= 0; i
< BIF_MAX
; i
++) {
209 /* call test function */
210 if ((*test_function
[i
].pf
)() != 0) {
211 printf ("error in %s test\n",
212 test_function
[i
].name
);
214 /* is it the first error? */
217 first_error_cycle
= act_cycle
;
219 /* do not use error_num 0 */
220 first_error_num
= i
+1;
221 strncpy (first_error_name
,
222 test_function
[i
].name
,
223 sizeof (first_error_name
));
229 /* were all tests of actual cycle OK? */
230 if (cycle_status
== 0)
233 /* set status LED if no error is occoured since yet */
237 printf ("%s: cycle %d finished\n", __FUNCTION__
, act_cycle
);
239 /* pause between cycles */
240 sdelay (BURN_IN_CYCLE_DELAY
);
243 if (global_vars_write_to_eeprom () != 0) {
245 printf ("%s: error writing global_vars to eeprom\n",
251 led_blink (); /* endless loop!! */
260 burn_in
, 1, 1, do_burn_in
,
261 "burn_in - start burn-in test application on TRAB\n",
263 " - start burn-in test application\n"
264 " The burn-in test could took a while to finish!\n"
265 " The content of the onboard EEPROM is modified!\n"
269 int do_dip (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[])
274 printf ("Usage:\n%s\n", cmdtp
->usage
);
278 if ((dip
= read_dip ()) == -1) {
282 for (i
= 0; i
< 4; i
++) {
283 if ((dip
& (1 << i
)) == 0)
295 "dip - read dip switch on TRAB\n",
297 " - read state of dip switch (S1) on TRAB board\n"
298 " read sequence: 1-2-3-4; ON=1; OFF=0; e.g.: \"0100\"\n"
302 int do_vcc5v (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[])
307 printf ("Usage:\n%s\n", cmdtp
->usage
);
311 if ((vcc5v
= read_vcc5v ()) == -1) {
315 printf ("%d", (vcc5v
/ 1000));
316 printf (".%d", (vcc5v
% 1000) / 100);
317 printf ("%d V\n", (vcc5v
% 100) / 10) ;
323 vcc5v
, 1, 1, do_vcc5v
,
324 "vcc5v - read VCC5V on TRAB\n",
326 " - read actual value of voltage VCC5V\n"
330 int do_contact_temp (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[])
335 printf ("Usage:\n%s\n", cmdtp
->usage
);
341 contact_temp
= tsc2000_contact_temp();
342 printf ("%d degree C * 100\n", contact_temp
) ;
348 c_temp
, 1, 1, do_contact_temp
,
349 "c_temp - read contact temperature on TRAB\n",
351 " - reads the onboard temperature (=contact temperature)\n"
355 int do_burn_in_status (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[])
358 printf ("Usage:\n%s\n", cmdtp
->usage
);
362 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_STATUS
, 1,
363 (unsigned char*) &status
, 1)) {
366 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_PASS_CYCLES
, 1,
367 (unsigned char*) &pass_cycles
, 2)) {
370 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_FIRST_ERROR_CYCLE
,
371 1, (unsigned char*) &first_error_cycle
, 2)) {
374 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_FIRST_ERROR_NUM
,
375 1, (unsigned char*) &first_error_num
, 1)) {
378 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_FIRST_ERROR_NAME
,
379 1, (unsigned char*)first_error_name
,
380 sizeof (first_error_name
))) {
384 if (read_max_cycles () != 0) {
388 printf ("max_cycles = %d\n", max_cycles
);
389 printf ("status = %d\n", status
);
390 printf ("pass_cycles = %d\n", pass_cycles
);
391 printf ("first_error_cycle = %d\n", first_error_cycle
);
392 printf ("first_error_num = %d\n", first_error_num
);
393 printf ("first_error_name = %.*s\n",(int) sizeof(first_error_name
),
400 bis
, 1, 1, do_burn_in_status
,
401 "bis - print burn in status on TRAB\n",
403 " - prints the status variables of the last burn in test\n"
404 " stored in the onboard EEPROM on TRAB board\n"
407 static int read_dip (void)
409 unsigned int result
= 0;
413 /***********************************************************
414 DIP switch connection (according to wa4-cpu.sp.301.pdf, page 3):
420 "On" DIP switch position short-circuits the voltage from
421 the input channel (i.e. '0' conversion result means "on").
422 *************************************************************/
424 for (i
= 7; i
> 3; i
--) {
426 if ((adc_val
= adc_read (i
)) == -1) {
427 printf ("%s: Channel %d could not be read\n",
433 * Input voltage (switch open) is 1.8 V.
434 * (Vin_High/VRef)*adc_res = (1,8V/2,5V)*1023) = 736
435 * Set trigger at halve that value.
438 result
|= (1 << (i
-4));
444 static int read_vcc5v (void)
448 /* VCC5V is connected to channel 2 */
450 if ((result
= adc_read (2)) == -1) {
451 printf ("%s: VCC5V could not be read\n", __FUNCTION__
);
455 * Calculate voltage value. Split in two parts because there is no
456 * floating point support. VCC5V is connected over an resistor divider:
457 * VCC5V=ADCval*2,5V/1023*(10K+30K)/10K.
459 result
= result
* 10 * 1000 / 1023; /* result in mV */
465 static int test_dip (void)
467 static int first_run
= 1;
468 static int first_dip
;
471 if ((first_dip
= read_dip ()) == -1) {
475 debug ("%s: first_dip=%d\n", __FUNCTION__
, first_dip
);
477 if (first_dip
!= read_dip ()) {
485 static int test_vcc5v (void)
489 if ((vcc5v
= read_vcc5v ()) == -1) {
493 if ((vcc5v
> VCC5V_MAX
) || (vcc5v
< VCC5V_MIN
)) {
494 printf ("%s: vcc5v[V/100]=%d\n", __FUNCTION__
, vcc5v
);
502 static int test_rotary_switch (void)
504 static int first_run
= 1;
509 * clear bits in CPLD, because they have random values after
512 *CPLD_ROTARY_SWITCH
|= (1 << 16) | (1 << 17);
514 first_rs
= ((*CPLD_ROTARY_SWITCH
>> 16) & 0x7);
516 debug ("%s: first_rs=%d\n", __FUNCTION__
, first_rs
);
519 if (first_rs
!= ((*CPLD_ROTARY_SWITCH
>> 16) & 0x7)) {
527 static int test_sram (void)
529 return (memory_post_tests (SRAM_ADDR
, SRAM_SIZE
));
533 static int test_eeprom (void)
535 unsigned char temp
[sizeof (EEPROM_TEST_STRING_1
)];
538 /* write test string 1, read back and verify */
539 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_TEST
, 1,
540 (unsigned char*)EEPROM_TEST_STRING_1
,
541 sizeof (EEPROM_TEST_STRING_1
))) {
545 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_TEST
, 1,
546 temp
, sizeof (EEPROM_TEST_STRING_1
))) {
550 if (strcmp ((char *)temp
, EEPROM_TEST_STRING_1
) != 0) {
552 printf ("%s: error; read_str = \"%s\"\n", __FUNCTION__
, temp
);
555 /* write test string 2, read back and verify */
557 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_TEST
, 1,
558 (unsigned char*)EEPROM_TEST_STRING_2
,
559 sizeof (EEPROM_TEST_STRING_2
))) {
563 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_TEST
, 1,
564 temp
, sizeof (EEPROM_TEST_STRING_2
))) {
568 if (strcmp ((char *)temp
, EEPROM_TEST_STRING_2
) != 0) {
570 printf ("%s: error; read str = \"%s\"\n",
578 static int test_contact_temp (void)
582 contact_temp
= tsc2000_contact_temp ();
584 if ((contact_temp
< MIN_CONTACT_TEMP
)
585 || (contact_temp
> MAX_CONTACT_TEMP
))
592 int i2c_write_multiple (uchar chip
, uint addr
, int alen
,
593 uchar
*buffer
, int len
)
598 printf ("%s: addr len other than 1 not supported\n",
603 for (i
= 0; i
< len
; i
++) {
604 if (i2c_write (chip
, addr
+i
, alen
, buffer
+i
, 1)) {
605 printf ("%s: could not write to i2c device %d"
606 ", addr %d\n", __FUNCTION__
, chip
, addr
);
610 printf ("chip=%#x, addr+i=%#x+%d=%p, alen=%d, *buffer+i="
611 "%#x+%d=%p=\"%.1s\"\n", chip
, addr
, i
, addr
+i
,
612 alen
, buffer
, i
, buffer
+i
, buffer
+i
);
621 int i2c_read_multiple ( uchar chip
, uint addr
, int alen
,
622 uchar
*buffer
, int len
)
627 printf ("%s: addr len other than 1 not supported\n",
632 for (i
= 0; i
< len
; i
++) {
633 if (i2c_read (chip
, addr
+i
, alen
, buffer
+i
, 1)) {
634 printf ("%s: could not read from i2c device %#x"
635 ", addr %d\n", __FUNCTION__
, chip
, addr
);
643 static int adc_read (unsigned int channel
)
645 int j
= 1000; /* timeout value for wait loop in us */
649 padc
= S3C2400_GetBase_ADC();
654 padc
->ADCCON
&= ~ADC_STDBM
; /* select normal mode */
655 padc
->ADCCON
&= ~(0x7 << 3); /* clear the channel bits */
656 padc
->ADCCON
|= ((channel
<< 3) | ADC_ENABLE_START
);
659 if ((padc
->ADCCON
& ADC_ENABLE_START
) == 0)
665 printf("%s: ADC timeout\n", __FUNCTION__
);
666 padc
->ADCCON
|= ADC_STDBM
; /* select standby mode */
670 result
= padc
->ADCDAT
& 0x3FF;
672 padc
->ADCCON
|= ADC_STDBM
; /* select standby mode */
674 debug ("%s: channel %d, result[DIGIT]=%d\n", __FUNCTION__
,
675 (padc
->ADCCON
>> 3) & 0x7, result
);
678 * Wait for ADC to be ready for next conversion. This delay value was
679 * estimated, because the datasheet does not specify a value.
687 static void adc_init (void)
691 padc
= S3C2400_GetBase_ADC();
693 padc
->ADCCON
&= ~(0xff << 6); /* clear prescaler bits */
694 padc
->ADCCON
|= ((65 << 6) | ADC_PRSCEN
); /* set prescaler */
697 * Wait some time to avoid problem with very first call of
698 * adc_read(). Without this delay, sometimes the first read
699 * adc value is 0. Perhaps because the adjustment of prescaler
700 * takes some clock cycles?
708 static void led_set (unsigned int state
)
710 S3C24X0_GPIO
* const gpio
= S3C24X0_GetBase_GPIO();
715 case 0: /* turn LED off */
716 gpio
->PADAT
|= (1 << 12);
718 case 1: /* turn LED on */
719 gpio
->PADAT
&= ~(1 << 12);
726 static void led_blink (void)
730 /* blink LED. This function does not return! */
732 reset_timer_masked ();
734 udelay (1000000 / LED_BLINK_FREQ
/ 2);
736 udelay (1000000 / LED_BLINK_FREQ
/ 2);
741 static void led_init (void)
743 S3C24X0_GPIO
* const gpio
= S3C24X0_GetBase_GPIO();
745 /* configure GPA12 as output and set to High -> LED off */
746 gpio
->PACON
&= ~(1 << 12);
747 gpio
->PADAT
|= (1 << 12);
751 static void sdelay (unsigned long seconds
)
755 for (i
= 0; i
< seconds
; i
++) {
761 static int global_vars_write_to_eeprom (void)
763 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_STATUS
, 1,
764 (unsigned char*) &status
, 1)) {
767 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_PASS_CYCLES
, 1,
768 (unsigned char*) &pass_cycles
, 2)) {
771 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_FIRST_ERROR_CYCLE
,
772 1, (unsigned char*) &first_error_cycle
, 2)) {
775 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_FIRST_ERROR_NUM
,
776 1, (unsigned char*) &first_error_num
, 1)) {
779 if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_FIRST_ERROR_NAME
,
780 1, (unsigned char*) first_error_name
,
781 sizeof(first_error_name
))) {
787 static void global_vars_init (void)
789 status
= 1; /* error */
791 first_error_cycle
= 0;
793 first_error_name
[0] = '\0';
799 static void test_function_table_init (void)
803 for (i
= 0; i
< BIF_MAX
; i
++)
804 test_function
[i
].pf
= dummy
;
807 * the length of "name" must not exceed 16, including the '\0'
808 * termination. See also the EEPROM address map.
810 test_function
[0].pf
= test_dip
;
811 test_function
[0].name
= "dip";
813 test_function
[1].pf
= test_vcc5v
;
814 test_function
[1].name
= "vcc5v";
816 test_function
[2].pf
= test_rotary_switch
;
817 test_function
[2].name
= "rotary_switch";
819 test_function
[3].pf
= test_sram
;
820 test_function
[3].name
= "sram";
822 test_function
[4].pf
= test_eeprom
;
823 test_function
[4].name
= "eeprom";
825 test_function
[5].pf
= test_contact_temp
;
826 test_function
[5].name
= "contact_temp";
830 static int read_max_cycles (void)
832 if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR
, EE_ADDR_MAX_CYCLES
, 1,
833 (unsigned char *) &max_cycles
, 2) != 0) {
840 static int dummy(void)
845 int do_temp_log (cmd_tbl_t
*cmdtp
, int flag
, int argc
, char *argv
[])
849 #if defined(CONFIG_CMD_DATE)
854 printf ("Usage:\n%s\n", cmdtp
->usage
);
859 delay
= simple_strtoul(argv
[1], NULL
, 10);
865 #if defined(CONFIG_CMD_DATE)
867 printf ("%4d-%02d-%02d %2d:%02d:%02d - ",
868 tm
.tm_year
, tm
.tm_mon
, tm
.tm_mday
,
869 tm
.tm_hour
, tm
.tm_min
, tm
.tm_sec
);
872 contact_temp
= tsc2000_contact_temp();
873 printf ("%d\n", contact_temp
) ;
877 * reset timer to avoid timestamp overflow problem
878 * after about 68 minutes of udelay() time.
880 reset_timer_masked ();
888 tlog
, 2, 1, do_temp_log
,
889 "tlog - log contact temperature [1/100 C] to console (endlessly)\n",
891 " - contact temperature [1/100 C] is printed endlessly to console\n"
892 " <delay> specifies the seconds to wait between two measurements\n"
893 " For each measurment a timestamp is printeted\n"